This section showcases the students I have recently guided and those I am currently guiding in their academic pursuits

Current Students

PRIYANGA DEVI L

Reg. No: 230900121 - PhD Scholar (February 2023)

Research Title: A Hybrid Approach to Software Fault Localization using Spectrum-Based Techniques and Machine Learning Models.

SHREEDATTA SUBHASH SAWANT

Reg. No: 220900153 - PhD Scholar (2023)

Research Title: Deep Learning based Text to Image Synthesis using Generative AI.

NARVEKAR ASHISH HARISHCHANDRA

Reg. No: 220900154 - PhD Scholar (February 2023)

Research Title: Enhanced Small and Partially Occluded Object Recognition through Deep Learning based Image Segmentation

KARTHIK S  

Reg. No:  220928009 - M.Tech (Software Engineering) [Schenider Electric Bangalore, Employee]

Project Title: Enhancing Software Defect Prediction with Class-Level Data: A Cascade Approach Using Artificial Bee Colony Feature Selection. 

Former Students

KISHOORE A M

Reg. No:  190953016 - B.Tech (CCE), MIT, MAHE, Manipal (2023)

Project Title: Software Fault Prediction using Cross-Project Analysis: A Study on Class Imbalance and Model Generalization.

Publication: https://ieeexplore.ieee.org/document/10521510

VELISETTI GEETHA PAVAN SAHASRANTH

Reg. No:  190953020 - B.Tech (CCE), MIT, MAHE, Manipal (2023)

Project Title: 1. A Holistic Approach to Software Fault Prediction with Dynamic Classification,  2. Generalization of Set of Features for the Software Fault Prediction Using Ant Colony-Based Feature Selection.

Publication: https://doi.org/10.1007/s10515-024-00467-4

Y VEERA RAGHAVREDDY 

Reg. No:  190911128 - B.Tech (IT), MIT, MAHE, Manipal (2023)

Project Title: Software Fault Prediction Using an Optimised Feature Selection Process Based on a Genetic Algorithm.

Publication: https://doi.org/10.15866/irea.v11i5.23539 

NIKHIL SAJI THOMAS

Reg. No:  200101010  - B.Tech (CSE), MAHE, Dubai Campus (Two-month internship in Manipal campus) (2022)

Project Title: An improved and optimized Random Forest based approach to predict the software faults.

Publication: https://doi.org/10.1007/s42979-024-02764-x